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19:00
Introduction
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Thomas Arnold
(European Spallation Source ERIC)
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19:15
Reinventing time-of-flight reflectometry—return of a proven approach
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Tim Charlton
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19:45
Free Thiols Regulatation of the Interactions and Self-Assembly of Thiol-Passivated Metal Nanoparticles investigated with X-ray scattering and MD simulations.
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Binhua Lin
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20:30
Why NeXus?
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Ray Osborn
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21:00
35 years of x-ray reflectivity at NSLS & NSLS II: science hiding in small features and the new kid (instrument) on the block
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Ben Ocko
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21:30
The Data Analysis Working Group
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Brian Maranville
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21:45
The Reproducibility Working Group
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Andrew McCluskey
(European Spallation Source ERIC)
